ELTE TTK SEM Lab.

Leiras

Dual Beam Scanning Electron Microscope (SEM/FIB)

Dual beam scanning electron microscope working at the Faculty of Science, Eötvös University, Budapest. This facility is a suitable tool for investigating conductive, insulating and biological samples. The following detectors are available in this apparatus: secondary electron detector (ETD), backscattered electron detectors (BSED, vCD), energy dispersive X-ray detector (silicon drift detector), scanning transmission detector (STEM), electron backscattered diffraction detector (EBSD).